PRODUCT RANGE OPTICAL SENSORS WM | RS-C Roughness standard Super Fine Characteristic honing structure X-ray detector Polished surface TECHNICAL SPECIFICATIONS Physical measuring principle Surface measuring white light interferometer (short coherent) Light source LED (blue) Weight / g ~ 750 Point cloud with >2 million individual measurement points (full ROI) ; STL mesh with >4 million Measuring field / Pixel triangles per individual measurement (full ROI) ; Report Vertical resolution* / nm <5 Unit dimension with lens / mm 53*71*159 Lens Magnification 10x 20x 50x 100x Numerical aperture (NA / AN)** 0,30 0,40 0,55 0,70 Working distance** / mm 7,4 4,7 3,4 2,0 Measuring field / (µm x µm) 1056,0 x 594,0 528,0 x 297,0 211,2 x 118,8 105,6 x 59,4 Horizontal resolution*** / nm 550 275 110 55 *The atomic shell is the actual physical resolution limit (without filtering) **The values may vary depending on the design of the lens used! ***The resolution limit is in any case the diffraction limit due to physical reasons! YOUR ADVANTAGES AT A GLANCE P High Productivity High flexibility Interchangeable system | Fully integrated in WM | Sensor can be changed like a touch probe | Integrated Quartis | Working in the component coordinate system | in 5-axis measuring machine WENZEL CORE | Use as Fully integrated in automated measuring sequence stand-alone device 125